List of materials analysis methods
List of materials analysis methods:
- μSR - see Muon spin spectroscopy
- χ - see Magnetic susceptibility
A
- Analytical ultracentrifugation - Analytical ultracentrifugation
- AAS - Atomic absorption spectroscopy
- AED - Auger electron diffraction
- AES - Auger electron spectroscopy
- AFM - Atomic force microscopy
- AFS - Atomic fluorescence spectroscopy
- APFIM - Atom probe field ion microscopy
- APS - Appearance potential spectroscopy
- ARPES - Angle resolved photoemission spectroscopy
- ARUPS - Angle resolved ultraviolet photoemission spectroscopy
- ATR - Attenuated total reflectance
B
- BET - BET surface area measurement (BET from Brunauer, Emmett, Teller)
- BiFC - Bimolecular fluorescence complementation
- BKD - Backscatter Kikuchi diffraction, see EBSD
- BRET - Bioluminescence resonance energy transfer
- BSED - Back scattered electron diffraction, see EBSD
C
- CAICISS - Coaxial impact collision ion scattering spectroscopy
- CARS - Coherent anti-Stokes Raman spectroscopy
- CBED - Convergent beam electron diffraction
- CCM - Charge collection microscopy
- CDI - Coherent diffraction imaging
- CE - Capillary electrophoresis
- CET - Cryo-electron tomography
- CL - Cathodoluminescence
- CLSM - Confocal laser scanning microscopy
- COSY - Correlation spectroscopy
- Cryo-EM - Cryo-electron microscopy
- Cryo-SEM - Cryo-scanning electron microscopy
- CV - Cyclic voltammetry
D
- DE(T)A - Dielectric thermal analysis
- dHvA - De Haas–van Alphen effect
- DIC - Differential interference contrast microscopy
- Dielectric spectroscopy - Dielectric spectroscopy
- DLS - Dynamic light scattering
- DLTS - Deep-level transient spectroscopy
- DMA - Dynamic mechanical analysis
- DPI - Dual polarisation interferometry
- DRS - Diffuse reflection spectroscopy
- DSC - Differential scanning calorimetry
- DTA - Differential thermal analysis
- DVS - Dynamic vapour sorption
E
- EBIC - Electron beam induced current (and see IBIC: ion beam induced charge)
- EBS - Elastic (non-Rutherford) backscattering spectrometry (see RBS)
- EBSD - Electron backscatter diffraction
- ECOSY - Exclusive correlation spectroscopy
- ECT - Electrical capacitance tomography
- EDAX - Energy-dispersive analysis of x-rays
- EDMR - Electrically detected magnetic resonance, see ESR or EPR
- EDS or EDX - Energy dispersive X-ray spectroscopy
- EELS - Electron energy loss spectroscopy
- EFTEM - Energy filtered transmission electron microscopy
- EID - Electron induced desorption
- EIT and ERT - Electrical impedance tomography and Electrical resistivity tomography
- EL - Electroluminescence
- Electron crystallography - Electron crystallography
- ELS - Electrophoretic light scattering
- ENDOR - Electron nuclear double resonance, see ESR or EPR
- EPMA - Electron probe microanalysis
- EPR - Electron paramagnetic resonance spectroscopy
- ERD or ERDA - Elastic recoil detection or Elastic recoil detection analysis
- ESCA - Electron spectroscopy for chemical analysis* see XPS
- ESD - Electron stimulated desorption
- ESEM - Environmental scanning electron microscopy
- ESI-MS or ES-MS - Electrospray ionization mass spectrometry or Electrospray mass spectrometry
- ESR - Electron spin resonance spectroscopy
- ESTM - Electrochemical scanning tunneling microscopy
- EXAFS - Extended X-ray absorption fine structure
- EXSY - Exchange spectroscopy
F
- FCS - Fluorescence correlation spectroscopy
- FCCS - Fluorescence cross-correlation spectroscopy
- FEM - Field emission microscopy
- FIB - Focused ion beam microscopy
- FIM-AP - Field ion microscopy–atom probe
- Flow birefringence - Flow birefringence
- Fluorescence anisotropy - Fluorescence anisotropy
- FLIM - Fluorescence lifetime imaging
- Fluorescence microscopy - Fluorescence microscopy
- FOSPM - Feature-oriented scanning probe microscopy
- FRET - Fluorescence resonance energy transfer
- FRS - Forward Recoil Spectrometry, a synonym of ERD
- FTICR or FT-MS - Fourier transform ion cyclotron resonance or Fourier transform mass spectrometry
- FTIR - Fourier transform infrared spectroscopy
G
- GC-MS - Gas chromatography-mass spectrometry
- GDMS - Glow discharge mass spectrometry
- GDOS - Glow discharge optical spectroscopy
- GISAXS - Grazing incidence small angle X-ray scattering
- GIXD - Grazing incidence X-ray diffraction
- GIXR - Grazing incidence X-ray reflectivity
- GLC - Gas-liquid chromatography
H
- HAADF - high angle annular dark-field imaging
- HAS - Helium atom scattering
- HPLC - High performance liquid chromatography
- HREELS - High resolution electron energy loss spectroscopy
- HREM - High-resolution electron microscopy
- HRTEM - High-resolution transmission electron microscopy
- HI-ERDA - Heavy-ion elastic recoil detection analysis
- HE-PIXE - High-energy proton induced X-ray emission
I
- IAES - Ion induced Auger electron spectroscopy
- IBA - Ion beam analysis
- IBIC - Ion beam induced charge microscopy
- ICP-AES - Inductively coupled plasma atomic emission spectroscopy
- ICP-MS - Inductively coupled plasma mass spectrometry
- Immunofluorescence - Immunofluorescence
- ICR - Ion cyclotron resonance
- IETS - Inelastic electron tunneling spectroscopy
- IGA - Intelligent gravimetric analysis
- IGF - Inert gas fusion
- IIX - Ion induced X-ray analysis: See Particle induced X-ray emission
- INS - Ion neutralization spectroscopy
Inelastic neutron scattering - IRNDT - Infrared non-destructive testing of materials
- IRS - Infrared spectroscopy
- ISS - Ion scattering spectroscopy
- ITC - Isothermal titration calorimetry
- IVEM - Intermediate voltage electron microscopy
L
- LALLS - Low-angle laser light scattering
- LC-MS - Liquid chromatography-mass spectrometry
- LEED - Low-energy electron diffraction
- LEEM - Low-energy electron microscopy
- LEIS - Low-energy ion scattering
- LIBS - Laser induced breakdown spectroscopy
- LOES - Laser optical emission spectroscopy
- LS - Light (Raman) scattering
M
- MALDI - Matrix-assisted laser desorption/ionization
- MBE - Molecular beam epitaxy
- MEIS - Medium energy ion scattering
- MFM - Magnetic force microscopy
- MIT - Magnetic induction tomography
- MPM - Multiphoton fluorescence microscopy
- MRFM - Magnetic resonance force microscopy
- MRI - Magnetic resonance imaging
- MS - Mass spectrometry
- MS/MS - Tandem mass spectrometry
- MSGE - Mechanically Stimulated Gas Emission
- Mössbauer spectroscopy - Mössbauer spectroscopy
- MTA - Microthermal analysis
N
- NAA - Neutron activation analysis
- Nanovid microscopy - Nanovid microscopy
- ND - Neutron diffraction
- NDP - Neutron depth profiling
- NEXAFS - Near edge X-ray absorption fine structure
- NIS - Nuclear inelastic scattering/absorption
- NMR - Nuclear magnetic resonance spectroscopy
- NOESY - Nuclear Overhauser effect spectroscopy
- NRA - Nuclear reaction analysis
- NSOM - Near-field optical microscopy
O
- OBIC - Optical beam induced current
- ODNMR - Optically detected magnetic resonance, see ESR or EPR
- OES - Optical emission spectroscopy
- Osmometry - Osmometry
P
- PAS - Positron annihilation spectroscopy
- Photoacoustic spectroscopy - Photoacoustic spectroscopy
- PAT or PACT - Photoacoustic tomography or photoacoustic computed tomography
- PAX - Photoemission of adsorbed xenon
- PC or PCS - Photocurrent spectroscopy
- Phase contrast microscopy - Phase contrast microscopy
- PhD - Photoelectron diffraction
- PD - Photodesorption
- PDEIS - Potentiodynamic electrochemical impedance spectroscopy
- PDS - Photothermal deflection spectroscopy
- PED - Photoelectron diffraction
- PEELS - parallel electron energy loss spectroscopy
- PEEM - Photoemission electron microscopy (or photoelectron emission microscopy)
- PES - Photoelectron spectroscopy
- PINEM - photon-induced near-field electron microscopy
- PIGE - Particle (or proton) induced gamma-ray spectroscopy, see Nuclear reaction analysis
- PIXE - Particle (or proton) induced X-ray spectroscopy
- PL - Photoluminescence
- Porosimetry - Porosimetry
- Powder diffraction - Powder diffraction
- PTMS - Photothermal microspectroscopy
- PTS - Photothermal spectroscopy
Q
R
- Raman - Raman spectroscopy
- RAXRS - Resonant anomalous X-ray scattering
- RBS - Rutherford backscattering spectrometry
- REM - Reflection electron microscopy
- RDS - Reflectance Difference Spectroscopy
- RHEED - Reflection high energy electron diffraction
- RIMS - Resonance ionization mass spectrometry
- RIXS - Resonant inelastic X-ray scattering
- RR spectroscopy - Resonance Raman spectroscopy
S
- SAD - Selected area diffraction
- SAED - Selected area electron diffraction
- SAM - Scanning Auger microscopy
- SANS - Small angle neutron scattering
- SAXS - Small angle X-ray scattering
- SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
- SCEM - Scanning confocal electron microscopy
- SE - Spectroscopic ellipsometry
- SEC - Size exclusion chromatography
- SEIRA - Surface enhanced infrared absorption spectroscopy
- SEM - Scanning electron microscopy
- SERS - Surface enhanced Raman spectroscopy
- SERRS - Surface enhanced resonance Raman spectroscopy
- SEXAFS - Surface extended X-ray absorption fine structure
- SICM - Scanning ion-conductance microscopy
- SIL - Solid immersion lens
- SIM - Solid immersion mirror
- SIMS - Secondary ion mass spectrometry
- SNMS - Sputtered neutral species mass spectrometry
- SNOM - Scanning near-field optical microscopy
- SPECT - Single photon emission computed tomography
- SPM - Scanning probe microscopy
- SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
- SSNMR - Solid-state nuclear magnetic resonance
- Stark spectroscopy - Stark spectroscopy
- STED - Stimulated Emission Depletion microscopy
- STEM - Scanning transmission electron microscopy
- STM - Scanning tunneling microscopy
- STS - Scanning tunneling spectroscopy
- SXRD - Surface X-ray Diffraction (SXRD)
T
- TAT or TACT - Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography - PAT)
- TEM - transmission electron microscope/microscopy
- TGA - Thermogravimetric analysis
- TIKA - Transmitting ion kinetic analysis
- TIMS - Thermal ionization mass spectrometry
- TIRFM - Total internal reflection fluorescence microscopy
- TLS - Photothermal lens spectroscopy, a type of Photothermal spectroscopy
- TMA - Thermomechanical analysis
- TOF-MS - Time-of-flight mass spectrometry
- Two-photon excitation microscopy - Two-photon excitation microscopy
- TXRF - Total reflection X-ray fluorescence analysis
U
- Ultrasound attenuation spectroscopy - Ultrasound attenuation spectroscopy
- Ultrasonic testing - Ultrasonic testing
- UPS - UV-photoelectron spectroscopy
- USANS - Ultra small-angle neutron scattering
- USAXS - Ultra small-angle X-ray scattering
- UV-Vis - Ultraviolet–visible spectroscopy
V
- VEDIC - Video-enhanced differential interference contrast microscopy
- Voltammetry - Voltammetry
W
- WAXS - Wide angle X-ray scattering
- WDX or WDS - Wavelength dispersive X-ray spectroscopy
X
- XAES - X-ray induced Auger electron spectroscopy
- XANES - XANES, synonymous with NEXAFS (Near edge X-ray absorption fine structure)
- XAS - X-ray absorption spectroscopy
- X-CTR - X-ray crystal truncation rod scattering
- X-ray crystallography - X-ray crystallography
- XDS - X-ray diffuse scattering
- XPEEM - X-ray photoelectron emission microscopy
- XPS - X-ray photoelectron spectroscopy
- XRD - X-ray diffraction
- XRES - X-ray resonant exchange scattering
- XRF - X-ray fluorescence analysis
- XRR - X-ray reflectivity
- XRS - X-ray Raman scattering
- XSW - X-ray standing wave technique
References
- Callister, WD (2000). Materials Science and Engineering - An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7.
- Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4.
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